Christian Flindt
University of Geneva
Wednesday, 8 September 2010, 11:15
Matfys library
Abstract:
Fluctuations of the electrical current running through a
nano-scale
device reveal information beyond what is contained in the average
current alone. In this talk I give an overview of my recent works on
counting statistics, the stochastic theory of charge transport in
nanostructures. I first discuss the theory behind a recent measurement
of high-order current correlations (cumulants) in a quantum dot and
show why the cumulants typically oscillate as functions of any system
parameter. This generic behavior has important implications for recent
proposals to measure entanglement entropy in a quantum point contact
as I will discuss. Finally, I present experimental and theoretical
results for the finite-frequency current correlations in a nano-scale
system.
Relevant papers: Phys. Rev. Lett. 100, 150601 (2008),
Proc. Natl. Acad. Sci. USA 106, 10116 (2009), arXiv:1009.xxxx (2010)